A new paper presenting a novel technique for simultaneously extrancting multiple model parameters for Organic Semiconductor materials from simple measurement data was published in Nature Scientific Reports. The paper results from research carried on by Pasquale Africa and Carlo de Falco of MOX in collaboration with Dario Datali of DEIB and Mario Caironi and Francesco Maddalena of CNST – IIT@Polimi. The paper is available open access at the following link:
Since 2016, MOX is collaborating with a leading tire manufacturing company for the development of reduced model for the analysis and prediction […]
A paper on a p-adaptive approach to LES modelling of compressible flows with DG methods has been published by Antonella Abbà, Luca […]
Based on the numerical tools developed in past projects carried on in collaboration with MOXOFF in the framework of a long lasting collaboration with Tetra […]
The next congress of the Italian Society of Industrial and Applied Mathematics will take place in Rome, Italy, from the 2nd to […]
