A new paper presenting a novel technique for simultaneously extrancting multiple model parameters for Organic Semiconductor materials from simple measurement data was published in Nature Scientific Reports. The paper results from research carried on by Pasquale Africa and Carlo de Falco of MOX in collaboration with Dario Datali of DEIB and Mario Caironi and Francesco Maddalena of CNST – IIT@Polimi. The paper is available open access at the following link:
The next congress of the Italian Society of Industrial and Applied Mathematics will take place in Rome, Italy, from the 2nd to […]
A workshop devoted to Fault tolerant algorithms and resiliency approaches for exascale computing was organized by SC4I at MOX on January 23-24 2019 in […]
A research project on the simulation of drill-string inside well bore has been defined with Tenaris, the world leader supplier of tubes […]
Carlo de Falco of MOX will be delivering a keynote presentation at the AMaSiS 2018 Workshop at WIAS Berlin in October. The workshop is […]
