A new paper presenting a novel technique for simultaneously extrancting multiple model parameters for Organic Semiconductor materials from simple measurement data was published in Nature Scientific Reports. The paper results from research carried on by Pasquale Africa and Carlo de Falco of MOX in collaboration with Dario Datali of DEIB and Mario Caironi and Francesco Maddalena of CNST – IIT@Polimi. The paper is available open access at the following link:
A workshop devoted to Fault tolerant algorithms and resiliency approaches for exascale computing was organized by SC4I at MOX on January 23-24 2019 in […]
A new MOX report proving the convergence of cell centered finite volume discretisations used in the OpenFOAM software for the Laplace operator […]
MOX is participating in the ESCAPE-2 FET H2020 project for the development of exascale demonstrators for numerical weather prediction. The tasks involve the development […]
Carlo de Falco of MOX will be delivering a keynote presentation at the AMaSiS 2018 Workshop at WIAS Berlin in October. The workshop is […]
